{"product_id":"9781032375106","title":"Advanced Materials Characterization : Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)","description":"\u003cp\u003eThe book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.\u003c\/p\u003e","brand":"CRC Press","offers":[{"title":"Default Title","offer_id":45423294644303,"sku":"00000_00000_00000_00000","price":6650.0,"currency_code":"TWD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0672\/9174\/2287\/files\/9781032375106-1.jpg?v=1780442728","url":"https:\/\/kinokuniya.com.tw\/products\/9781032375106","provider":"Books Kinokuniya Taiwan","version":"1.0","type":"link"}