{"product_id":"9781498779470","title":"Optical Inspection of Microsystems, Second Edition (2ND)","description":"\u003cp\u003eThis book provides an up-to-date survey of the most important and widely used full-field optical metrology and inspection technologies. Techniques such as interference microscopy, laser Doppler vibrometry, holography, speckle metrology, spectroscopy and deflectrometry and digital holographic microscropy for the inspection of MEMS.\u003c\/p\u003e","brand":"CRC Press Inc","offers":[{"title":"Default Title","offer_id":45558568812623,"sku":"00000_00000_00000_00000","price":11466.0,"currency_code":"TWD","in_stock":true}],"url":"https:\/\/kinokuniya.com.tw\/products\/9781498779470","provider":"Books Kinokuniya Taiwan","version":"1.0","type":"link"}