{"product_id":"9789400797987","title":"Design, Analysis and Test of Logic Circuits under Uncertainty (Lecture Notes in Electrical Engineering)","description":"\u003cp\u003eLogic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques.\u003c\/p\u003e","brand":"Springer Verlag","offers":[{"title":"Default Title","offer_id":45520314335311,"sku":"00000_00000_00000_00000","price":3850.0,"currency_code":"TWD","in_stock":false}],"url":"https:\/\/kinokuniya.com.tw\/products\/9789400797987","provider":"Books Kinokuniya Taiwan","version":"1.0","type":"link"}