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Failure Analysis : High Technology Devices (De Gruyter Stem)

Sullivan, Daniel J. D./ Carleton, Eric J.
3,395 TWD
Member Price
3,056
English

Product Description

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

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The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

... Read Full Text

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