High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip (Computer Architecture and Design Methodologies)

3,850 TWD
Member Price
3,465
English

Product Description

This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors.

Unavailable

This product is currently out of stock. Please check back later.

Discount is applied at checkout.

Recently Viewed Items

Related Products